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02 — Application · Design

Virtual Design of Materials, Processes & Equipment

Computational models become most valuable when they change a design decision. We translate multiscale understanding into virtual environments where material composition, surface chemistry, process conditions, geometry, and equipment parameters can be evaluated together. Our primary domain is semiconductor manufacturing, spanning materials and interfaces, etching and deposition, feature evolution, and reactor transport. The same framework supports the design and optimization of broader functional materials.

What we work on

01

Semiconductor materials & interfaces

We study how composition, defects, microstructure, and interfaces govern electronic, mechanical, thermal, and chemical behavior. DFT, molecular dynamics, and machine-learning force fields reveal mechanisms in conductive films, oxide semiconductors, two-dimensional materials, and bonding interfaces. These mechanisms become physically meaningful design variables for materials and downstream processes.

Electronic structureDefectsInterfacesStructure–property
02

Etching & plasma-surface processes

Etching is a coupled materials–process–equipment problem. We connect equipment conditions and plasma states to the species, energies, and angles arriving at the wafer, then resolve the resulting surface reactions, implantation, sputtering, and material removal. Current applications include cryogenic and high-aspect-ratio etching, plasma annealing, and profile evolution.

Cryogenic etchHARPlasma–surfaceProfile
03

Deposition & thin-film processes

We model the chemical and physical steps by which thin films form. First-principles and atomistic simulations resolve adsorption, ligand elimination, surface activation, nucleation, and inhibitor selectivity, while kinetic and transport models extend these mechanisms to film growth and feature coverage. Applications include ALD, PEALD, area-selective ALD, CVD, and MOCVD.

ALDAS-ALDCVDMOCVDkMC
04

Equipment & reactor modeling

Equipment-level conditions determine the environment in which surface reactions occur. CFD, plasma chemistry, and particle-transport models connect power, pressure, flow, temperature, and reactor geometry to the reactive species and energy delivered to the wafer. Coupling these models with surface simulation reveals how machine-level parameters drive material evolution.

CFDPlasma chemistryDSMCReactor transport
05

Functional materials design

The same virtual design methodology extends beyond semiconductor manufacturing. Our work includes functional polymers and nanocomposites, electro-functional materials for environmental applications, energy-absorbing structures, oxide semiconductors, and two-dimensional or chalcogenide materials. Across these systems, the common problem is to connect composition, molecular structure, interfaces, and processing to a target function.

PolymersNanocompositesOxides2D materials
06

Data-driven design & optimization

AI and optimization make large design spaces computationally tractable. Surrogate models, Bayesian and multi-objective optimization, active learning, and inverse-design strategies identify promising materials, structures, and process windows without exhaustive trial and error. Physics-based models provide constraints and interpretable descriptors, while data-driven methods determine where to search next.

Bayesian optimizationMOPSOActive learningInverse design
Process condition and component design: simulation-driven deep learning and multi-objective optimization explore the process space, and the same models guide reactor component design.
The same methodology extends to functional materials: polymer physics, interfaces, surface science, and perovskites.

How we work

Materials & interfaces
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DFT

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MD

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MLFF

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Electronic and structural descriptors

Process mechanisms
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Reaction pathways

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Surface kinetics

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kMC

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Feature evolution

Equipment & transport
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CFD

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Chemkin

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DSMC

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Reactor and plasma modeling

Design & optimization
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Surrogate models

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Bayesian optimization

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Multi-objective optimization

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Active learning

Validation
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Experimental databases

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Process measurements

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Material and device metrics

Selected papers in this area

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